Every µΩ Counts
Every µΩ Counts
The eConnect Contact Bushing delivers a game-changing approach to busbar electrical connections, eliminating the need for costly electroplating while achieving superior conductivity. Extensive real-world testing demonstrates its effectiveness—copper-to-copper joints using the ECCB Contact Bushing show up to 85% lower resistance than unprepared bolted joints, while aluminum-to-aluminum connections see resistance drop from 397µΩ to just 35µΩ, an improvement of 91%. By piercing oxidation layers with its high-surface-area knurl design, the Bushing ensures consistent, low-resistance electrical contact without the added cost and complexity of plating.
This breakthrough is transforming EV electrical architectures, improving power efficiency, reducing heat generation, and simplifying manufacturing. A press-in installation allows for both mechanical and electrical fastening in a single step, making it an ideal solution for ADAS, infotainment, and high-voltage power distribution. As automotive electrification advances, every µΩ counts - and eConnect provides a proven, cost-effective way to optimize electrical connections for the next generation of vehicles.
Reimagining Electrical Busbar Connections without Plating
As vehicle electrification advances, OEMs are reimagining electrical archivectures, replacing traditional writing with busbars for efficiency, durability, and power optimisation.
Comprehensive lab testing and real-world application data confirm that eConnect Contact Bushing dramatically reduces resistance compared to conventional busbar joints:
- Copper-to-Copper Joint (No Plating) – Traditional joints showed a resistance of 105µΩ, whereas the eConnect Contact Bushing reduced resistance to just 20µΩ—an improvement of 80%, nearly matching the resistance of an uninterrupted copper busbar (16µΩ).
- Aluminum-to-Aluminum Joint (No Plating) – Conventional methods resulted in an extremely high resistance of 397µΩ, primarily due to oxidation layers and poor conductivity at the joint. With eConnect, this resistance dropped to just 35µΩ, an improvement of 91%, making aluminum a much more viable and efficient material for high-current applications.
Baseline Busbar Resistance – To put these numbers into context, a solid 80mm copper busbar without any joints measures 16µΩ, while an 80mm aluminum busbar measures 26µΩ across the same 80mm length of busbar. The eConnect Contact Bushing maintains resistance levels close to these benchmarks, ensuring minimal energy loss and maximum power transfer efficiency.
| Busbar Connection Type | Resistance (µΩ) | Key Takeaway |
|---|---|---|
| Copper Busbar (No Joint) | 16 µΩ | Baseline copper resistance |
| Copper-to-Copper Joint (Traditional) | 105 µΩ | 6.5x increase in resistance due to poor connection quality |
| Copper-to-Copper Joint with ECCB | 20 µΩ | 80% reduction in resistance, nearly matching the busbar itself |
| Aluminium Busbar (No Joint) | 26 µΩ | Baseline aluminium resistance |
| Aluminium-to-Aluminium Joint (Traditional) | 397 µΩ | 15x increase in resistance, leading to significant power loss |
| Aluminium-to-Aluminium Joint with ECCB | 35 µΩ | 91% reduction in resistance, improving conductivity drastically |
Electrical Resistance Matters in Vehicle Architecture
In EVs and advanced automotive electrical systems, every µΩ counts when it comes to optimizing power distribution and efficiency:
- Lower resistance reduces energy loss, maximizing battery utilization and driving range.
- Minimized heat generation prevents thermal degradation of electrical components, ensuring long-term system reliability.
- Improved conductivity enhances the performance of ADAS, infotainment, and power electronics, where stable power delivery is crucial.
Key Benefits eConnect Contact Bushing:
Plating: Requirement eliminated. Traditional plating to lower resistance adds cost, complexity and manufacturing delays. The ECCB achieves the same low resistance without plating, cutting costs and simplifying production.
Try our cost comparison calculator to determine your savings: https://dev-jlo2-penn-engineering.pantheonsite.io/pem/cost-comparison-calculator/
Reduces Resistance for Both Copper & Aluminum: Oxide layer build-up increases resistance on both copper and aluminum busbars. The ECCB’s high-surface-area knurling pierces the oxide layer, enabling consistent electrical contact and reducing resistance by up to 91%.
Improves Power Efficiency & Reduces Heat: Every µΩ counts in high current applications. Lower resistance reduces heat buildup, improving thermal management and system longevity.
The eConnect Contact Bushing is designed for next-generation vehicle electronics, enabling reliable power connections in ADAS, infotainment, and high-voltage power distribution. By providing a secure, low-resistance connection without the need for plating, it enhances efficiency in radar, LiDAR, connectivity systems, and centralized computing architectures.
By eliminating plating requirements, reducing resistance losses, and simplifying installation, PEM® eConnect is transforming EV electrical systems. This innovative solution streamlines manufacturing while improving conductivity and durability, making it a key enabler of the future of vehicle electrification.